NI PXIe-5113 PXI oscilloscope
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The NI PXIe-5113 PXI oscilloscope is a powerful test instrument based on the PXI
The NI PXIe-5113 PXI oscilloscope is a powerful test instrument based on the PXI platform that provides a flexible and reliable measurement solution for engineers and researchers in electronics, transportation, aerospace, automotive, electrical and other fields. The following is a detailed introduction to the NI PXIe-5113 PXI oscilloscope:
Technical specifications:
Number of channels: Having two channels enables users to observe and analyze two analog signals simultaneously.
Sampling rate: The sampling rate of each channel is up to 3 GS/s (gigabit samples per second), ensuring the accurate capture of high-speed signals.
Analog bandwidth: 500 MHz analog bandwidth, suitable for the measurement of broadband signals.
Resolution: 8-bit resolution, which provides sufficient precision for the quantization of the signal.
Storage capacity: Equipped with 512 MB of onboard memory for storing captured data for subsequent analysis.
Functional features:
Flexible configuration: Through programming, users can flexibly set parameters such as coupling, input impedance, voltage range and filtering to adapt to different test requirements.
Multiple trigger modes: Multiple trigger modes are supported to ensure that the captured signal matches the user's measurement needs.
High-speed data transfer: The built-in instrument driver for high-speed data transfer ensures that the captured data can be quickly transferred to the computer for analysis.
Built-in analysis function: Built-in multiple analysis functions, such as FFT (Fast Fourier transform), etc., to facilitate users to analyze the captured signal in the frequency domain.
Advanced PXI synchronization and data throughput capabilities: Support for advanced PXI synchronization and data throughput capabilities that work with other instruments in the PXI system to improve overall test efficiency.
CableSense technology (supported on some models) : Detects and locates faults, changes, or discontinuities in signal paths, improving test reliability and accuracy.
Application field:
The NI PXIe-5113 PXI oscilloscope is suitable for full and partial automation applications requiring flexible measurement configurations and analog bandwidths up to 500 MHz. For example, it can play an important role in the fields of electronic design verification, automated testing, production testing, troubleshooting, and research and development.
Compatibility:
The oscilloscope is compatible with software development environments such as NI LabVIEW, which allows users to create custom test and measurement applications. It is also compatible with interactive software such as NI SignalExpress for the rapid generation of data acquisition and analysis applications.
In summary, the NI PXIe-5113 PXI oscilloscope is a powerful, flexible and reliable test instrument suitable for a variety of applications requiring high precision and high speed signal measurement.
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