NI PXIe -2515 Signal Insertion Switch Module
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NI PXIe-2515 Signal Insertion Switch Module is a high-performance signal inserti
NI PXIe-2515 Signal Insertion Switch Module is a high-performance signal insertion switch module launched by National Instruments. Designed for use in PXI Express systems, this module provides engineers and scientists with a flexible and reliable solution for signal routing, test automation, and multi-channel measurement applications.
Key features of the PXIe-2515 module include:
High-performance switch matrix: This module has multiple switch channels and can be configured in multiple routing modes to meet the needs of different test scenarios. Switch switching is fast and stable, ensuring precise signal routing.
Signal insertion function: PXIe-2515 supports signal insertion function, allowing users to insert external signal sources into the test path during the test process for fault injection, signal simulation or calibration.
Programmability and flexibility: Users can program and control the PXIe-2515 through NI’s measurement and automation software, such as LabVIEW or Measurement Studio. The module supports a variety of switch configurations and routing modes, and can be flexibly adjusted according to test requirements.
High reliability and durability: PXIe-2515 uses high-quality electronic components and precision mechanical design to ensure the stability and reliability of the module under long-term operation and high load conditions.
Compatibility and scalability: As part of the PXI Express system, PXIe-2515 can be seamlessly integrated with other PXI modules to build a powerful test system. At the same time, it can also be used with other National Instruments hardware and software products to implement more complex test applications.
The PXIe-2515 signal insertion switch module is suitable for various test scenarios, including circuit testing, communication testing, automated test systems, etc. It can help engineers quickly build and configure test systems, improve test efficiency, and reduce test costs.
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